NPL scientists have achieved a significant breakthrough in the metrology of organic photovoltaics for solar power applications. The research demonstrated a method that can 'see' down into a working organic photovoltaic cell and relate its three-dimensional nanoscale structure to its performance.
The new measurement method is based on a technique called photoconducting atomic force microscopy (pc-AFM) that uses a nanoscale probe to measure topography and photocurrent generation at the same time. By discriminating between surface and subsurface information this technique can provide direct correlation between the nanometre scale morphology of a working organic solar cell and its performance characteristics.
This breakthrough will increase understanding of the technology, allowing manufacturers to improve the efficiency of their products by optimising the nanometre scale structure of the organic photovoltaic devices.
For more see: www.npl.co.uk
For more attend: Printed Electronics USA 2011.